Author:
Fawcett T. G.,Crowder C. E.,Brownell S. J.,Zhang Y.,Hubbard C.,Schreiner W.,Hamill G. P.,Huang T. C.,Sabino E.,Langford J. I.,Hamilton R.,Louër D.
Abstract
With the explosive growth in the number of highly automated powder diffraction systems, many types of analyses which were previously considered a specialty analysis are now performed on a routine basis. Algorithms have been developed for measuring peak profiles from which crystallite sizes, residual microstrain, and X-ray crystal structure (Rietveld techniques for example) can be determined. However, these techniques require an instrumental peak profile calibration standard to correct the experimental data for instrumental broadening due to the system optics.Significant problems are encountered when laboratories try to cross-correlate or reproduce published data due to the lack of a common reference material for instrumental calibration. This is particularly distressing in microstrain and crystallite size calculations which can be dramatically affected by a poor choice of standard materials. Microstrain and crystallite size measurement are becoming increasingly important for the characterization of advanced materials and catalysts.
Publisher
Cambridge University Press (CUP)
Subject
Condensed Matter Physics,Instrumentation,General Materials Science,Radiation
Reference9 articles.
1. The Fitting of Powder Diffraction Profiles to Ananalytical Express Ion and the Influence of Line Broadening Factors
2. Brown A. , private communication.
3. Cox D. E. , Toby B. H. and Eddy M. M. , Proceedings of the International Symposium on X-Ray Powder Diffractometry, Freemantle (1987) to be published in Aust. J. Phys.
4. Goebel H. , private communication.
5. Instrumental Capabilites in X-Ray Diffraction Analysis: Comparative Techniques
Cited by
16 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献