Author:
O'Connor Brian H.,Raven Mark D.
Abstract
AbstractResults are given of an assessment of a Rietveld-type X-ray powder diffraction pattern fitting structure refinement technique for assaying powdered mixtures as an alternative to conventional discrete peak empirical methods of the type described by Klug and Alexander (1974) and Chung (1974). The values obtained for a mixture of corundum and α-quartz, following calibration of the instrument with a profile of the former, indicate that this technique has excellent potential as an analytical tool.
Publisher
Cambridge University Press (CUP)
Subject
Condensed Matter Physics,Instrumentation,General Materials Science,Radiation
Cited by
256 articles.
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