Author:
Pitschke W.,Krabbes G.,Mattern N.
Abstract
Indexed X-ray powder diffraction data are reported for the semiconducting compound Ba2Cl2Cu3O4. The structure was refined by the Rietveid technique on the basis of the space group I4/mmm. Refined unit cell dimensions area= 5.5156(1) Å,c= 13.8221(3) Å,V= 420.49 Å3Dx= 4.74 g/cm3,F30= 129(0.0075,30),M20= 121,Rp= 6.58,Rwp= 8.66, andRB= 4.49.
Publisher
Cambridge University Press (CUP)
Subject
Condensed Matter Physics,Instrumentation,General Materials Science,Radiation
Reference26 articles.
1. New computer program for Rietveld analysis of powder diffraction patterns;Wiles;J. Appl. Crystallogr.,1981
2. Powder Diffraction File, JCPDS-International Centre for Diffraction Data, Newton Square Corporate Campus, 12 Campus Boulevard, Newton Square, PA 19073-3273.
3. Incorporation of microabsorption corrections into Rietveid analysis
4. FN: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing
Cited by
9 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献