XRD study of phase transformations in lithiated graphite anodes by Rietveld method

Abstract

Commercial anodes with different state of charge are investigated by X-ray diffraction technique using Rietveld method for data collected with standard laboratory equipment. It is shown that full profile refinement gives good approximation for quantitative description of the charge/discharge process and may be used for estimation of real state of charge (SoC). Careful analysis of the diffraction profile with Rietveld method allows us to quantitatively distinguish the contribution of different LixC6 phases and estimate the real SoC.