A Study of Grazing Incidence Configurations and Their Effect on X-Ray Diffraction Data

Abstract

AbstractIn recent years, grazing incidence angle attachments have been shown to be very useful in the phase identification of thin polycrystalline films. These devices are sold commercially as attachments to standard powder diffractometers. The attachment normally consists of a long soller slit assembly and a flat crystal monochromator. The soller slit with or without the monochromator is mounted on the diffracted beam side. In this paper we discuss the effects of different configurations from collimator to monochromator on diffraction data. An understanding of these effects is essential in order to obtain more reliable information on phase transformations, crystallite size, microstrain, and residual stress studies.