Abstract
Due to the exceptional performance of most modern commercial transmission electron microscopes, the achievement of phase-contrast imaging resolution in the sub-2Å range is today a routine exercise, provided the samples are compliant. Nonetheless, there remains room for improvement, and the purpose of this manuscript is to highlight procedures that might be employed by the practicing microscopist for advancing conventional high resolution electron microscopy.
Publisher
Cambridge University Press (CUP)
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3. This work is supported by the Director, Office of Energy Research, Office of Basic Energy Sciences, Division of Materials Sciences, U.S. Department of Energy, under Contract No. DE-AC03»76SF00098.
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