Author:
Baumeister W.,Seredynski J.
Abstract
Specimens in the electron microscope are inevitably exposed to an
intense flux of ionizing radiation which more or less dramatically
deteriorates the structure under investigation. While optimists may comfort
themselves by feeling that, irrespective of some damage, the specimens still
retain quite a close resemblence to the original structure, pessimists
suspect that all significant 'high resolution' information is destroyed. A
rational approach towards reconciling these extreme views is to ask what the
specimen is, chemically speaking, when a certain number of electrons has
traversed it. The assessment of the limits of structural fidelity to be
expected for a given class of specimens is the prime objective of radiation
damage research as it pertains to electron microscopy. Unravelling the
sequence of events leading to the final product is another aim which,
besides academic satisfaction, may have some important repercussions in as
much as an understanding of the mechanisms controlling structural
reorganization might facilitate the design of remedial procedures for
reducing damage, which we need so badly.
Publisher
Cambridge University Press (CUP)
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