Atomic Structure-Sensitive Magnetic Domain Structures of Thin Films

Abstract

Transmission electron microscopy, TEM, that can serve for observation of both atomic and magnetic structures is useful to investigate structure sensitive magnetic properties. It is most effective when it is applied to thin films for which direct interpretation of the results is possible without considering additional effects through specimen handling for TEM use and modification of dimension dependent magnetic properties.Transmission Lorentz microscopy, TLM, to observe magnetic domains has been known for a quarter century. Among TLM modes the defocused mode has been most popular due to its simple way of operation. Recent development of TEM made it possible that an average instrument commercially available could be easily operated at any TLM modes to produce high quality images. This paper mainly utilizes the Foucault mode to investigate domain walls and magnetization ripples as the finest details of domain structure.