3-D reconstruction from serial thick sections, with multiple-level profiling within stereo pairs, using the albany HVEM's “SSRECN” software

Abstract

We have designed and written a program, SSRECN, for making 3-D reconstructions from contours in parallel planes. In our work with serial thick sections, we find a need to sample the object at multiple levels in depth, and we suggest a means for doing this.SSRECN was written with the biological electron microscopist in mind, and its capabilities cover all common requirements for such work. Additional features are added as special user needs come up. Special care was taken to make it “user friendly”; it is menu-driven, with liberal helps and explanations available on-line, and requires no prior computer experience or reading of documentation. Error traps prevent frustration due to accidental loss of data or program crashes. Its comprehensive and versatile database system provides for handling three-dimensional contour data (including depth connection instructions for reconstruction of branching structures) at all points in the program, both as single contours and as groups (i.e. individual contours of a single organelle and also those of a group of organelles of the same type).