Bend contours and KM zone-axis patterns maps from aluminum

Abstract

Zone axis patterns maps from pure Aluminum have been obtained using two kinds of crystallographic contrast technique in TEM: bend contours (BCP) and Kossel-Mollenstedt (KMP) patterns. Observations of zone axis patterns on the BCP map enable to carry out orientations determination accurately and directly in the image plane. Both kinds of map were assembled from a large number of micrographs taken at 100 kV on Philips EM 300 microscopes using double-tilt specimens holder to set up suitable regions in various orientations. BCP were obtained with conventional objective lens whereas for KMP convergent beam illumination was required.