On Line Digital Image Analysis and Processing in HREM

Abstract

HREM has proved to be a powerful technique with wide applications in the materials sciences, but the images even from very thin crystals are not always simple to interpret reliably. Independent knowledge of the specimen thickness, microscope aberrations and operating defocus is usually required for a proper understanding or calculation of high resolution images. Offline, images must be exhaustively matched with those computed from theoretical models incorporating a range of conditions, together with optical diffractometer analysis using a laser optical bench (ODM). This process is time consuming and does not always produce satisfactory results.