Abstract
The paper summarized some of the authors data on the transmission electron microscope (TEM) investigations using bend-contours(BC)the transformations of crystal lattice orientations on crystallization of amorphous films and recrystallization. Most investigations were made in situ in JEOL and TESLA microscopes under the influence of the electron beam, Fig.3-5, 8,9. In some cases the video record was produced, some clippings supposed to be demonstrated.1. The possibilities of BC method were outlined earlier (e.g.1). In particular they are similar to Kikuchi lines method and sometimes are more powerful. However these and some other options are rarely used in practice though BC patterns often present on the TEM images and carry the unique diffraction information written in the image plane. The merits of BC method in the evaluation of the lattice orientation, if compared with traditional selected area diffraction(SAD)-high locality, the possibilities of simultaneous analysis of large areas(fields of orientations) and visual ability, the demerits - fitness only to crystals with large orientation gradients(more than 10−2rad/μm).
Publisher
Cambridge University Press (CUP)