Author:
Christenson K. K.,Eades J. A.
Abstract
One of the strengths of the Philips EM-400 series of TEMs is their ability to operate under two distinct optical configurations: “microprobe”, the normal TEM operating condition which allows wide area illumination, and “nanoprobe”, which gives very small probes with high angular convergence for STEM imaging, microchemical and microstructural analyses. This change is accomplished by effectively turning off the twin lens located in the upper pole piece which changes the illumination from a telefocus system to a condenser-objective system. The deflection and tilt controls and alignments are designed for microprobe use and do not function properly when in nanoprobe. For instance, in nanoprobe the deflection control gives a mix of deflection and tilt; as does the tilt control.
Publisher
Cambridge University Press (CUP)
Reference4 articles.
1. Christenson, K. K. and Eades, J. A. , Proc. XI Inti. Cong. EM (1986) 763.
2. The sharpness of Kikuchi lines and their use in setting the height of the objective aperture in a TEM
3. This work was supported by the U.S. Department of Energy, Division of Materials Sciences, contract DE-AC02-76ER01198. We would like to thank Alex Greene and Ernie Sammann for their help on this project.