Abstract
The lifetimes of the components of a device depend on each other because of their joint dependence on the environmental conditions. We introduce intrinsic age processes, one for each component, to handle such dependence. The data required can be obtained by experiments under controlled laboratory conditions. The computations needed for randomly varying conditions are recursive and can be used for making decisions regarding maintenance and replacement.
Publisher
Cambridge University Press (CUP)
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research,Statistics, Probability and Uncertainty,Statistics and Probability
Cited by
80 articles.
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