1. Distortion of secondary ion extraction due to sample surface irregularities;Bedrich;Internatl conf on secondary ion mass spectrometry, 3rd, Proc: Springer series in chemical physics,1983
2. Gurfinkel D M , 1984, 14C sample preparation: Isotrace 1984 ann rept, p 5–30.
3. Beukens R P and Lee H W , 1981, The production of small carbon samples by RF dissociation of acetylene, in Kutschera W , eds, Symposium on accelerator mass spectrometry, 2nd, Proc: Argonne Natl Lab, p 416–425.