Determination of a-Axis Orientations of Polycrystalline Ice

Abstract

AbstractTwo new methods have been devised for measurement of crystallographic lattice orientations of individual crystals in polycrystalline ice. The first uses edge-length ratios of etch pits. The second uses a combination of optical measurement on a thin section and etch-pit technique. Although the second method does not work for crystals with theirc-axis oriented parallel to the thin section, it is much simpler and more practical than the first method. When used on polycrystalline glacier ice, this method gave the threea-axes orientations as well asc-axis orientation for each crystal with an accuracy of 5°.