Author:
KRÁSA JOSEF,LÁSKA LEOš,ROHLENA KAREL,PEŘINA VRATISLAV,HNATOWICZ VLADIMÍR
Abstract
The energy spectra of heavy ions emitted from laser-produced
plasmas were determined by the use of a technique relying on
the implantation of plasma ions into a substrate located close
to the plasma. Ion energy spectra were reconstructed from depth
profiles of the implanted ions measured by the standard Rutherford
back-scattering (RBS) technique employing 2 MeV alpha particles
scattered at 170° laboratory angle. The energy spectra of
Ag, Au, Sn, and Pb ions, implanted into aluminum or steel foils,
are presented. A review of other techniques for ion energy spectrum
measurement is presented and their limitations are discussed.
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Cited by
11 articles.
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