Author:
Wu J.,Wang L.,Qiu A.,Han J.,Li M.,Lei T.,Cong P.,Qiu M.,Yang H.,Lv M.
Abstract
AbstractExperiments of the return current post installed X-pinches were carried out on the 1-MA “QiangGuang-1” facility with the purpose of understanding X-pinch characteristics under this setup and establishing X-pinch backlighting diagnostics for the wire-array Z-pinches. Different wire-array loads along with the two-wire 30 µm Mo X-pinch backlighter were tested. The X-pinches emit the X-ray radiation with the burst time variation of ± 4 ns and the bright spot size of ~30 µm. X-ray backlighting shadowgraphy images of the over-mass and radiation-suppressed Z-pinch wire array were obtained.
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
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