Reproducible lamella preparation for electron cryo-tomography by in-situ thickness estimation during fluorescence-guided FIB milling-Reference-Cited by-同舟云学术

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Reproducible lamella preparation for electron cryo-tomography by in-situ thickness estimation during fluorescence-guided FIB milling

Published:2022-08-01 Issue:S1 Volume:28 Page:1210-1211
ISSN:1435-8115
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Skoupy Radim¹²,Boltje Daan B²³,Hoogenboom Jacob P²,Jakobi Arjen J¹

Affiliation:

1. Kavli Institute of Nanoscience Delft University of Technology Department of Bionanoscience, , Delft, The Netherlands

2. Delft University of Technology Department of Imaging Physics, , Delft, The Netherlands

3. Delmic B.V. , Delft, The Netherlands

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/28/S1/1210/48823378/mam1210.pdf

Reference5 articles.

1. Preparing samples from whole cells using focused-ion-beam milling for cryo-electron tomography

2. ENZEL – A cryogenic, coincident fluorescence, electron, and ion beam solution for the cryo-electron tomography workflow;Boltje;Microscopy and Microanalysis,2021

3. Comparison of absorption, luminescence and scintillation characteristics in Lu1.95Y0.05SiO5:Ce,Ca and Y2SiO5:Ce scintillators

4. Calibration-less quantitative 4D-STEM imaging of amorphous samples

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Robust Local Thickness Estimation of Sub‐Micrometer Specimen by 4D‐STEM;Small Methods;2023-05-30

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