Temporally Resolved HyperSpectral Analysis vs Radiation Damage in Hard and Soft Matter
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference12 articles.
1. This research was funded in part by Laboratory Directed Research and Development (LDRD) funding No. 2017-153-N0 at Argonne National Laboratory by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, it employed resources in the Center for Nanoscale Materials, an Office of Science user facility.
2. Soft Matter X-ray Microanalysis in the Analytical Electron Microscope
3. Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope
4. Differential Mass Loss in Dried Sodium Phosphate Buffer Under Electron Beam Irradiation
5. Radiation effects on X-ray microanalysis of a light element alloy in a medium-voltage electron microscope
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