Monitoring Bismuth Ferrite Domain Walls Behavior Under Electric Field With Atomic Resolution By <i>In Situ</i> Scanning Transmission Electron Microscopy-Reference-Cited by-同舟云学术

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Monitoring Bismuth Ferrite Domain Walls Behavior Under Electric Field With Atomic Resolution By In Situ Scanning Transmission Electron Microscopy

Published:2022-08-01 Issue:S1 Volume:28 Page:2272-2274
ISSN:1435-8115
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Condurache Oana-Andreea¹²,Dražić Goran¹²³,Rojac Tadej¹²,Dkhil Brahim⁴,Bradeško Andraž⁴,Uršič Hana¹²,Benčan Andreja¹²

Affiliation:

1. Jožef Stefan Institute Electronic Ceramics Department, , Ljubljana, Slovenia

2. Jožef Stefan International Postgraduate School , Ljubljana, Slovenia

3. National Institute of Chemistry Department of Materials Chemistry, , Ljubljana, Slovenia

4. Université Paris-Saclay Laboratoire Structures, Propriétés et Modélisation des Solides, CentraleSupélec, , Paris, France

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/28/S1/2272/48822609/mam2272.pdf

Reference6 articles.

1. Aberration corrected STEM techniques to investigate polarization in ferroelectric domain walls and vortices

2. Local hard and soft pinning of 180° domain walls in BaTiO3 probed by in situ transmission electron microscopy

3. Monitoring Electrical Biasing of Pb(Zr0.2Ti0.8)O3 Ferroelectric Thin Films In Situ by DPC-STEM Imaging

4. Nanodomains and nanometer-scale disorder in multiferroic bismuth ferrite single crystals

5. Atomically resolved structure of step-like uncharged and charged domain walls in polycrystalline BiFeO3

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