High Resolution X-Ray Spectra for Chemical Speciation in the SEM-Reference-Cited by-同舟云学术

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High Resolution X-Ray Spectra for Chemical Speciation in the SEM

Published:2021-07-30 Issue:S1 Volume:27 Page:1360-1363
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Schreiber Katherine,McNeel Daniel,Koehler Katrina,Smith Chandler,Stein Benjamin,Wagner Gregory,Bowes Eric,Xu Lei,Fontes Christopher,Batista Enrique,Yang Ping,Rabin Michael,Croce Mark,Carpenter Matthew

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference7 articles.

1. Accuracy, precision and detection limits of SEM-WDS, SEM-EDS and PIXE in the multi-elemental analysis of medieval glass

2. Method for evaluating chemical shifts of x-ray emission lines in molecules and solids

3. Review of superconducting transition-edge sensors for x-ray and gamma-ray spectroscopy

4. Hyperspectral X-ray Imaging with TES Detectors for Nanoscale Chemical Speciation Mapping

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Naive data mining and machine learning for high resolution, sparse x-ray spectra;Applications of Machine Learning 2022;2022-10-03

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