Chemical State Mapping of Amorphous Carbon Films by Soft X-ray Emission Spectroscopy-Reference-Cited by-同舟云学术

Chemical State Mapping of Amorphous Carbon Films by Soft X-ray Emission Spectroscopy

Published:2019-08 Issue:S2 Volume:25 Page:1754-1755
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Terauchi Masami,Sato Yohei

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference5 articles.

1. Results of a-CNx and DLC are collaborated ones with Prof. Aono of Kagoshima Univ. and Prof. Takakuwa of Tohoku Univ., respectively. Those works were partly supported by the Research Program of “Dynamic Alliance for Open Innovation Bridging Human, Environment and Materials” in “Network Joint Research Centre for Materials and Devices”.

2. Preparation and properties of photoconductive amorphous carbon nitride a-CN films: the layer-by-layer method

3. Soft X-ray emission spectroscopy study of characteristic bonding states and its distribution of amorphous carbon-nitride (a-CNx) films

4. Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution

5. Study of Amorphous Carbon Nitride Films Aiming at White Light Emitting Devices

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