Author:
MacArthur Katherine E.,Slater Thomas J. A.,Haigh Sarah J.,Ozkaya Dogan,Nellist Peter D.,Lozano-Perez Sergio
Abstract
AbstractThe new generation of energy-dispersive X-ray (EDX) detectors with higher count rates than ever before, paves the way for a new approach to quantitative elemental analysis in the scanning transmission electron microscope. Here we demonstrate a method of calculating partial cross sections for use in quantifying EDX data, beneficial especially because of the simplicity of its implementation. Applying this approach to acid-leached PtCo catalyst nanoparticles leads to quantitative determination of the Pt surface enrichment.
Publisher
Cambridge University Press (CUP)
Cited by
42 articles.
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