Quantification of Contrast Difference Between Monoclinic and Tetragonal Zirconia in Low-kV SEM-Reference-Cited by-同舟云学术

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Quantification of Contrast Difference Between Monoclinic and Tetragonal Zirconia in Low-kV SEM

Published:2022-08-01 Issue:S1 Volume:28 Page:560-563
ISSN:1435-8115
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Arpatappeh Farzin A¹,Ow-Yang Cleva¹²,Parapari Sorour Semsari³,Çorapçıoğlu Gülcan⁴,Gülgün Mehmet Ali¹²,Papila Melih¹⁵

Affiliation:

1. Sabancı University , Faculty of Engineering and Natural Sciences, Istanbul , Turkey

2. Sabancı University , SUNUM Nanotechnology Research and Application Center, Istanbul , Turkey

3. Jozef Stefan Institute , Ljubljana, Slovenia

4. Koç University , Central Research Infrastructure Directorate, Istanbul, Turkey

5. BaX Composites , Istanbul, Turkey

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/28/S1/560/48823583/mam0560.pdf

Reference14 articles.

1. Field-emission SEM imaging of compositional and doping layer semiconductor superlattices

2. Electronic contribution to secondary electron compositional contrast in the scanning electron microscope

3. Deactivation and diffusion of boron in ion-implanted silicon studied by secondary electron imaging

4. Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy

5. Direct visualization of highly resistive areas in GaN by means of low-voltage scanning electron microscopy

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