Atom Probe Tomography and analytical Scanning Transmission Electron Microscopy of Rapid Solidification Microstructures in Al-Cu Alloy Thin Films-Reference-Cited by-同舟云学术

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Atom Probe Tomography and analytical Scanning Transmission Electron Microscopy of Rapid Solidification Microstructures in Al-Cu Alloy Thin Films

Published:2017-07 Issue:S1 Volume:23 Page:688-689
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Wiezorek Jorg M.K.,Zweiacker Kai W.,Liu Can,Martin Isabelle,Prosa Ty. J.,Larson David J.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference8 articles.

1. In situ transmission electron microscopy of crystal growth-mode transitions during rapid solidification of a hypoeutectic Al–Cu alloy

2. Rapid lateral solidification of pure Cu and Au thin films encapsulated in SiO2

3. Time-Resolved In Situ Measurements During Rapid Alloy Solidification: Experimental Insight for Additive Manufacturing

4. Selection of microstructures in rapid solidification processing

5. The authors acknowledge funding from the National Science Foundation, Grants NSF-1105757 and NSF-1607922.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Probing effects of solute trapping on the mechanical properties of α-Al in rapidly solidified hypoeutectic Al-10at.%Cu after surface laser melting;Materials Science and Engineering: A;2024-01

2. Probing Effects of Solute Trapping on the Mechanical Properties Of A-Al in Rapidly Solidified Hypoeutectic Al-10at.%Cu after Surface Laser Melting;2023

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