Methods for Multi-Layer van der Waals Heterostructures Topological Materials Discovery via STEM and LEEM-Reference-Cited by-同舟云学术

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Methods for Multi-Layer van der Waals Heterostructures Topological Materials Discovery via STEM and LEEM

Published:2022-08-01 Issue:S1 Volume:28 Page:1702-1703
ISSN:1435-8115
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Bell David C¹,Ozsoy-Keskinbora Cigdem¹,Akey Austin²,Devarakonda Aravind³³,Fu Liang³,Kaxiras Efthimios⁴,Checkelsky Joseph³

Affiliation:

1. Harvard University Harvard John A. Paulson School of Engineering and Applied Sciences, , Cambridge, MA USA

2. Center for Nanoscale Systems, Harvard University , Cambridge, MA, USA

3. Department of Physics , MIT Cambridge, MA, USA

4. Harvard University Department of Physics, , Cambridge, MA, USA

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/28/S1/1702/48823615/mam1702.pdf

Reference7 articles.

1. Low Voltage Electron Microscopy

2. Dirac fermions and flat bands in the ideal kagome metal FeSn

3. Massive Dirac fermions in a ferromagnetic kagome metal

4. A flat band-induced correlated kagome metal;Ye;arXiv preprint arXiv,2021

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