Expanding the Capability of Xe Plasma Focused Ion Beam Sample Preparation for Transmission Electron Microscopy
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference9 articles.
1. Xe+ FIB Milling and Measurement of Amorphous Silicon Damage
2. TEM Specimen Preparation with Plasma FIB Xe+ Ions
3. Gallium penetration of aluminum: in-situ TEM observations at the penetration front
4. Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope
5. Liquid metal embrittlement
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Improved Sample Preparation Technique for Transmission Kikuchi Diffraction (TKD) Analyses Allows Large Area Data Acquisition;Microscopy and Microanalysis;2023-07-22
2. Focused Ion Beam Preparation of Low Melting Point Metals: Lessons Learned from Pb/Sn Solders;Microscopy and Microanalysis;2022-08-01
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