Author:
Johnson Matthew T.,Gilliss Shelley R.,Carter C. Barry
Abstract
The use of Pt to mark the initial location of heterophase boundaries
in solid-state reactions was extended to investigate the motion of
interfaces during a thin-film solid-state reaction between
In2O3 and MgO in the presence of an electric field.
The Pt markers were prepared by sputtering a thin Pt film onto a
single-crystal substrate. The resulting multilayer was then heated prior
to thin-film deposition to de-wet the Pt film and thus form an array of
small, isolated particles. These particles serve as fine-scale markers for
tracking the motion of interfaces. However, there are certain situations in
which the markers can move with the interface.
Publisher
Cambridge University Press (CUP)
Cited by
12 articles.
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