Characterization of Interfaces and Defects in Multiferroic Aurivillius Phase Thin Films by STEM and EELS-SI-Reference-Cited by-同舟云学术

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Characterization of Interfaces and Defects in Multiferroic Aurivillius Phase Thin Films by STEM and EELS-SI

Published:2022-08-01 Issue:S1 Volume:28 Page:2378-2380
ISSN:1435-8115
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Bagués Núria¹,Colfer Louise²,Schmidt Michael²,Keeney Lynette²,McComb David W¹³

Affiliation:

1. Center for Electron Microscopy and Analysis, The Ohio State University , Columbus, OH, USA

2. Tyndall National Institute, University College Cork Advanced Materials and Surfaces Group, , Lee Maltings Complex, Dyke Parade, Ireland

3. Ohio State University Dept. of Material Science and Engineering, , Columbus, Ohio 43212, US

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/28/S1/2378/48824178/mam2378.pdf

Reference7 articles.

1. Direct visualization of magnetic-field-induced magnetoelectric switching in multiferroic aurivillius phase thin films

2. Direct atomic scale determination of magnetic ion partition in a room temperature multiferroic material

3. Charged Domain Wall and Polar Vortex Topologies in a Room-Temperature Magnetoelectric Multiferroic Thin Film

4. Bi3n+1Ti7Fe3n–3O9n+11 Homologous Series: Slicing Perovskite Structure with Planar Interfaces Containing Anatase-like Chains

5. Crystal Structure, Defects, Magnetic and Dielectric Properties of the Layered Bi3n+1Ti7Fe3n–3O9n+11 Perovskite-Anatase Intergrowths

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