Volume Imaging By Tracking Sparse Topological Features In Electron Micrograph Tilt Series-Reference-Cited by-同舟云学术

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Volume Imaging By Tracking Sparse Topological Features In Electron Micrograph Tilt Series

Published:2022-08-01 Issue:S1 Volume:28 Page:242-244
ISSN:1435-8115
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Petersen T C¹,Zhao C²³,Bøjesen E D¹²³,Broge N L N²³,Hata S⁴,Liu Y⁵,Etheridge J¹

Affiliation:

1. Monash University Monash Centre for Electron Microscopy, , Clayton, Victoria, Australia

2. Aarhus University Interdisciplinary Nanoscience Centre, , Aarhus, , Denmark

3. Midtjylland Interdisciplinary Nanoscience Centre, , Aarhus, , Denmark

4. Kyushu University Department of Advanced Materials Science, , Fukuoka, Japan

5. The Australian National University Research School of Chemistry, , Canberra, Acton, Australia

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/28/S1/242/48822255/mam0242.pdf

Reference14 articles.

1. Electron Tomography of Nanoparticle Catalysts on Porous Supports: A New Technique Based on Rutherford Scattering

2. Deciphering chemical order/disorder and material properties at the single-atom level

3. Observing crystal nucleation in four dimensions using atomic electron tomography

4. A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography

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