Post-FIB Specimen Preparation of Atom Probe Specimens under Controlled Environments for Correlative Microscopy
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference5 articles.
1. An environmental transfer hub for multimodal atom probe tomography
2. Removal of Ga Implantation on FIB-prepared Atom Probe Specimens Using Small Beam and Low Energy Ar+ Milling
3. In situ site-specific specimen preparation for atom probe tomography
4. Targeted Ion Milling of Ex Situ Lift-Out FIB Specimens
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Argon Milling of Bulk and Post-FIB Specimens for Multi-Length Scale Analyses by EBSD, TEM, and APT under Controlled Environments;Microscopy and Microanalysis;2022-08-01
2. Optimal Specimen Preparation for Correlative Atom Probe Tomography and Electron Microscopy of Environmentally Sensitive Materials;Microscopy and Microanalysis;2021-07-30
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