Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't-Reference-Cited by-同舟云学术

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Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't

Published:2020-07-30 Issue:S2 Volume:26 Page:442-443
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Findlay Scott,Allen Leslie,Brown Hamish,Chen Zhen,Ciston Jim,Ikuhara Yuichi,Ishikawa Ryo,Ophus Colin,Sánchez-Santolino Gabriel,Seki Takehito,Shibata Naoya,Weyland Matthew

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference16 articles.

1. Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons

2. Atom-Scale Ptychographic Electron Diffractive Imaging of Boron Nitride Cones

3. Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy

4. Phase contrast STEM for thin samples: Integrated differential phase contrast

5. Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron Probe

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Notes and References;Principles of Electron Optics, Volume 3;2022

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