Advanced SIMION Techniques: Boundary Matching and Genetic Optimization-Reference-Cited by-同舟云学术

Advanced SIMION Techniques: Boundary Matching and Genetic Optimization

Published:2015-06 Issue:S4 Volume:21 Page:218-223
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Dowsett D.

Abstract

AbstractTwo techniques for use with SIMION [1] are presented, boundary matching and genetic optimization. The first allows systems which were previously difficult or impossible to simulate in SIMION to be simulated with great accuracy. The second allows any system to be rapidly and robustly optimized using a parallelized genetic algorithm. Each method will be described along with examples of real world applications.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference14 articles.

1. Biased sample holder for complete correction of SIMS transmission losses with tilted samples

2. Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis

3. Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy

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