Parallel Mode Differential Phase Contrast in Transmission Electron Microscopy, II: K2CuF4 Phase Transition

Author:

Paterson Gary W.ORCID,Macauley Gavin M.ORCID,McVitie StephenORCID,Togawa YoshihikoORCID

Abstract

AbstractIn Part I of this diptych, we outlined the theory and an analysis methodology for quantitative phase recovery from real-space distortions of Fresnel images acquired in the parallel mode of transmission electron microscopy (TEM). In that work, the properties of the method, termed TEM-differential phase contrast (TEM-DPC), were highlighted through the use of simulated data. In this work, we explore the use of the TEM-DPC technique with experimental cryo-TEM images of a thin lamella of a low-temperature two-dimensional (2D) ferromagnetic material, K2CuF4, to perform two tasks. First, using images recorded below the ordering temperature, we compare the TEM-DPC method with the transport of intensity one for phase recovery and discuss the relative advantages the former has for experimental data. Second, by tracking the induction of the sample as it is driven through a phase transition by heating, we extract estimates for the critical temperature and critical exponent of the order parameter. The value of the latter is consistent with the 2D XY class, raising the prospect that a Kosterlitz–Thoules transition may have occurred.

Funder

Carnegie Trust for the Universities of Scotland

Japan Society for the Promotion of Science

Ministry of Education, Culture, Sports, Science and Technology

Engineering and Physical Sciences Research Council

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference35 articles.

1. Evaluation of Magnetic Head Field Using Three-Dimensional Magnetic Field Measurement System.

2. Destruction of long-range order in one-dimensional and two-dimensional systems having a continuous symmetry group I. Classical systems;Berezinskii;J Exp Theor Phys,1971

3. Magnetization and universal sub-critical behaviour in two-dimensional XY magnets

4. Sample preparation for atomic-resolution STEM at low voltages by FIB

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3