Author:
Rathi Monika,Ahrenkiel S.P.,Carapella J.J.,Wanlass M.W.
Abstract
AbstractGiven an unknown multicomponent alloy, and a set of standard compounds or alloys of known composition, can one improve upon popular standards-based methods for energy dispersive X-ray (EDX) spectrometry to quantify the elemental composition of the unknown specimen? A method is presented here for determining elemental composition of alloys using transmission electron microscopy–based EDX with appropriate standards. The method begins with a discrete set of related reference standards of known composition, applies multivariate statistical analysis to those spectra, and evaluates the compositions with a linear matrix algebra method to relate the spectra to elemental composition. By using associated standards, only limited assumptions about the physical origins of the EDX spectra are needed. Spectral absorption corrections can be performed by providing an estimate of the foil thickness of one or more reference standards. The technique was applied to III-V multicomponent alloy thin films: composition and foil thickness were determined for various III-V alloys. The results were then validated by comparing with X-ray diffraction and photoluminescence analysis, demonstrating accuracy of approximately 1% in atomic fraction.
Publisher
Cambridge University Press (CUP)
Reference20 articles.
1. Hubbell J.H. & Seltzer S.M. (1996). Tables of X-ray mass attenuation coefficients and mass energy-absorption coefficients from 1 keV to 20 MeV for elements Z = 1 to 92 and 48 additional substances of dosimetric interest. NISTIR 5632. Gaithersburg, MD: National Institute of Standards and Technology.
2. Impact of 40 Years of Technology Advances on EDS System Performance
3. Scanning Electron Microscopy and X-ray Microanalysis
4. 40% efficient metamorphic GaInP∕GaInAs∕Ge multijunction solar cells
5. High-efficiency solar cells from III-V compound semiconductors
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