Time-Resolved High-Resolution Transmission Electron Microscopy Using a Piezo-Driving Specimen Holder for Atomic-Scale Mechanical Interaction

Abstract

Time-resolved high-resolution transmission electron microscopy at a spatial resolution of 0.2 nm and a time resolution of 1/60 sec using a piezo-driving specimen holder is reported here. Various types of atomic processes in mechanical interaction, such as contact, bonding, deformation, and fracture, in nanometer-sized gold crystallites and carbon nanotubes are demonstrated.