Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces-Reference-Cited by-同舟云学术

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Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces

Published:2020-07-30 Issue:S2 Volume:26 Page:76-77
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Kollmer Felix,Pirkl Alexander,Kayser Sven,Arlinghaus Henrik,Moellers Rudolf,Havercroft Nathan,Niehuis Ewald

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference4 articles.

1. SIMS of organics—Advances in 2D and 3D imaging and future outlook

2. NanoFab SIMS: High Spatial Resolution Imaging and Analysis Using Inert-Gas Ion Beams

3. The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power

4. Ultra high spatial resolution SIMS with cluster ions - approaching the physical limits

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Probing the nature of soil organic matter;Critical Reviews in Environmental Science and Technology;2021-09-26

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