Temperature-dependent signals in STEM Electron Beam-Induced Current (EBIC) Imaging
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
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1. Schottky Emission Through Thin Insulating Films
2. Development of a High Lateral Resolution Electron Beam Induced Current Technique for Electrical Characterization of InGaN-Based Quantum Well Light Emitting Diodes
3. This work has been supported by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA, by National Science Foundation (NSF) award DMR-1611036, and by NSF STC award DMR-1548924. The authors acknowledge the use of instruments at the Electron Imaging Center for NanoMachines supported by NIH 1S10RR23057 and the CNSI at UCLA.
4. Simple calculation of energy distribution of low‐energy secondary electrons emitted from metals under electron bombardment
5. Imaging interfacial electrical transport in graphene–MoS2 heterostructures with electron-beam-induced-currents
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