Are vacancies in field ion microscopy artefacts? A DFT study
Author:
Affiliation:
1. Max-Planck-Institut für Eisensforschung Computational Materials design, , Düsseldorf, Germany
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
https://academic.oup.com/mam/article-pdf/28/S1/754/48822460/mam0754.pdf
Reference5 articles.
1. Towards the three-dimensional field ion microscope;Vurpillot;Surf. Interface Anal,2007
2. Observation of vacancies in the field-ion microscope;Speicher;Phys. Lett,1966
3. The occurrence of field-induced surface vacancies on iridium field-ion microscope specimens;Page;Surf. Sci,1973
4. Revealing atomic-scale vacancy-solute interaction in nickel;Morgado;Scr. Mater,2021
5. Generalized dipole correction for charged surfaces in the repeated-slab approach;Freysoldt;Phys. Rev. B,2020
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