Structure and electrical property changes of ZnO:Al films, prepared by radio frequency magnetron sputtering, by thermal annealing
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Published:2015-08
Issue:S3
Volume:21
Page:1797-1798
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ISSN:1431-9276
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Container-title:Microscopy and Microanalysis
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language:en
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Short-container-title:Microsc Microanal
Author:
Chen Yi-Yan,Chen Po-Yu,Cheng Shao-Liang,Huang Bo-Ming,Yang Jer-Ren,Kawasaki Masahiro,Shiojiri Makoto
Publisher
Cambridge University Press (CUP)