Scanning Hard X-Ray Microscopy Based on Be CRLs-Reference-Cited by-同舟云学术

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Scanning Hard X-Ray Microscopy Based on Be CRLs

Published:2018-08 Issue:S2 Volume:24 Page:188-189
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Schropp Andreas,Bruckner Dennis,Bulda Jessica,Falkenberg Gerald,Garrevoet Jan,Seiboth Frank,Wittwer Felix,Koch Frieder,David Christian,Schroer Christian G.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference8 articles.

1. Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses

2. Perfect X-ray focusing via fitting corrective glasses to aberrated optics

3. Moonlight receptor of the "1-h-midge"Clunio marinusstudied by micro-XRF

4. Scanning Hard X-ray Microscopy Imaging Modalities for Geobiological Samples

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Precise wavefront characterization of x-ray optical elements using a laboratory source;Review of Scientific Instruments;2022-07-01

2. CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV;Powder Diffraction;2020-08-05

3. PtyNAMi: ptychographic nano-analytical microscope;Journal of Applied Crystallography;2020-07-30

4. Full-field hard X-ray microscopy based on aberration-corrected Be CRLs;X-Ray Nanoimaging: Instruments and Methods IV;2019-09-09

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