Visualization of Crystallographic Defects in InSb Micropillars by Ptychographic Topography
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference6 articles.
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1. In situ compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraints;Journal of Applied Crystallography;2023-02-28
2. Imaging Ultrafast Dynamical Diffraction Wave Fronts in Strained Si with Coherent X Rays;Physical Review Letters;2021-10-08
3. Measurement of the coherent beam properties at the CoSAXS beamline;Journal of Synchrotron Radiation;2021-10-05
4. X-ray ptychographic topography: A robust nondestructive tool for strain imaging;Physical Review B;2021-04-30
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