A TEM Nanoanalytic Investigation of Pd/Ge Ohmic Contacts for the Miniaturization and Optimization of InGaAs nMOSFET Devices.
-
Published:2009-07
Issue:S2
Volume:15
Page:1212-1213
-
ISSN:1431-9276
-
Container-title:Microscopy and Microanalysis
-
language:en
-
Short-container-title:Microsc Microanal
Author:
Longo P,Jansen W,Merckling C,Penaud J,Caymax M,Thayne IG,Craven AJ
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Publisher
Cambridge University Press (CUP)