Investigation of the Image Contrast in an Ultra-Low Voltage Scanning Electron Microscope Using an Auger Electron Spectrometer-Reference-Cited by-同舟云学术

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Investigation of the Image Contrast in an Ultra-Low Voltage Scanning Electron Microscope Using an Auger Electron Spectrometer

Published:2019-11-22 Issue:4 Volume:26 Page:758-767
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Sakuda Yusuke,Asahina Shunsuke,Togashi Takanari,Terasaki Osamu,Kurihara Masato

Abstract

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference17 articles.

1. Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials

2. Chemical states analysis by Auger microprobe with hemispherical energy analyzer;Sakai;J Surface Anal,1999

3. Electron energy-loss spectroscopy in the TEM

4. Novel structural characterisations of insulating and electron beam sensitive materials employing low voltage high resolution scanning electron microscopy;Terasaki;JEOL News,2013

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study of Reversal Contrast Phenomenon in SEM Images at Low Incident Accelerating Voltage by AES;Vacuum and Surface Science;2020-06-10

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