Abstract
Exact and approximate mathematical models for the effects of sample transparency on the powder diffraction intensity data are examined. Application of the formula based on the first-order approximation about the deviation angle is justified for realistic measurement and computing systems. The effects of sample transparency are expressed by double convolution formulas applying two different scale transforms, including three parameters, goniometer radius R, penetration depth μ−1, and thickness of the sample t. The deconvolutional treatment automatically recovers the lost intensity and corrects the peak shift and asymmetric deformation of peak profile caused by the sample transparency.
Publisher
Cambridge University Press (CUP)
Subject
Condensed Matter Physics,Instrumentation,General Materials Science,Radiation
Cited by
2 articles.
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