Small-angle scattering of X-rays in a conventional Bragg–Brentano diffractometer for quantitative analysis

Abstract

A technique is presented utilizing an unmodified commercial X-ray diffractometer, equipped with a Bragg–Brentano geometry, for reducing preferred orientation effects in measured intensities during quantitative diffraction analysis. The diffractometer setup examined makes possible data acquisition with Θ fixed at 1° and 2Θ scanning the Bragg line. The results obtained with this technique are shown in the quantitative X-ray diffraction analysis of three international standards of carbonate rocks (401,402,403).