Author:
Vasudevan R.,Ramesh R.,Pathiraj B.,Kolster B.H.
Abstract
AbstractThe importance of surface roughness to the measurement of integrated intensity in X-ray powder diffraction is discussed following studies conducted with materials in both powder and bulk (rolled sheet/billet) forms possessing different absorption characteristics. A simple procedure is described which allows for surface roughness effect.
Publisher
Cambridge University Press (CUP)
Subject
Condensed Matter Physics,Instrumentation,General Materials Science,Radiation