Simultaneous Determination of Layer Thickness, Composition, and Mass Absorption by X-Ray Diffraction

Abstract

AbstractThis paper describes a new method for the simultaneous determination of mineral composition, mass thickness and mass absorption coefficient of a thin layer of a crystalline substance deposited on a crystalline substrate.The samples were deposited on membrane disc filters, consisting of mixtures of cellulose acetate and cellulose nitrate. Quantitative results are achieved by measuring the diffraction intensity of the analyte and the attenuation of a reflection of the crystalline material supporting the deposited sample. The mean accuracy of the analysis was found to be: ≈ 3% for mass thickness, ≈ 1% for mass absorption coefficient and ≈ 4% for quantitative mineralogical determination.