Abstract
Over the several years that imaging energy filters have been available commercially, numerous and wide-ranging applications have demonstrated elemental mapping with a resolution approaching 1 nm. A few reports have even shown resolutions <0.4 nm. Elemental mapping by energy-filtered transmission electron microscopy (Eftem) is clearly an attractive and powerful tool, but some aspects of the techniques can be complex, with many pitfalls awaiting the unwary. This tutorial aims to cover some practical aspects of elemental mapping by Eftem. It is based largely on the author's work at the ORNL Share User Facility, where Eftem research has been performed since 1994 with a Gatan imaging filter (GIF) interfaced to a Philips CM30T operated at 300 kV with a LaB6cathode. Most of the applications have been to metals and ceramics, emphasizing interfacial segregation and precipitation.
Publisher
Cambridge University Press (CUP)
Reference21 articles.
1. Research at the Oak Ridge National Laboratory (ORNL) Share User Facility sponsored by the Division of Materials Sciences and Engineering, U.S. Department of Energy, under contract DE-AC05-00OR22725 with UT-Bateile LLC. Thanks to my many collaborators but especially to Drs. Anderson Ian , Carpenter Ray , Evans Neal , Ernie Hall, Ed Kenik, Libera Matt , Pint Bruce , Phil Rice, Sharma Renu , Wang Z.L. and Jim Wittig.
2. Mapping The Valence States of Transition Metals Across Interfaces By Energy-Filtered Tem
3. Mapping the Valence States of Transition-Metal Elements Using Energy-Filtered Transmission Electron Microscopy
4. Bonding in Ion-Implanted Diamond-Like Carbon Films Characterized by TEM Spectrum Lines and Energy-Filtered Imaging